Detection and characterization of organics in semiconductor DI water processes
By Ven Anantharaman et al.
Determination of total silica at PPB levels in high-purity water by three different analytical techniques
By Theresa Chu & Marjorie K. Balazs
Filtration performance of deionized water filters when challenged with colloidal silica solutions
By Kevin Pate & Lisa Hollister
Particulate contamination control in high-purity water for the semiconductor industry
By Dennis Capitanio et al.
Is 0.03 µm detection the next advancement
By Mike Henley
Bacterial ecology of operating laboratory water purification systems
By Gordon A. McFeters et al.
An investigation into the limits of the SEM particle counting method
By Michael K. Patterson
Extractable analysis of modified polyvinylidene fluoride polymers utilized in deionization water application
By James Holton et al.
Chracterization of organic impurities in high-purity water systems by AOC and TOC
By Robert R. Governal et al.