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SEMI Billings Report

North American semiconductor equipment billings grow 2.6%; Worldwide semiconductor sales up slightly in March

By Mike Henley

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Photo courtesy of Evoqua Water Technologies LLC. VANOX is a trademark of Evoqua its subsidiaries and affiliates in some countries.

Microelectronics

Can Advanced Oxidation Technology Help Control TOC In Semiconductor Water?

By Glen Sundstrom, Bruce Coulter, Chris Hall & Alan Knapp

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Microelectronics

Semiconductor News: SEMI reports 2016 worldwide semiconductor equipment sales reached $41.2 billion; Equipment makers post almost $2 billion in February billings

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Microelectronics

How to Streamline Wastewater Treatment Systems and Make Money Out Of Waste

By Jochen Ruth & Gerd Heser

World semiconductor sales dec 2016

News

SEMI book-to-bill ratio closed at 1.06 in December

Compiled by Mike Henley 

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Microelectronics

R&D Patent Trends 1992-2002: The evolving distribution of technical approaches to UPW for Microelectronics

By Michael Bigwood, PhD

World semiconductor sales dec 2016

News

SEMI book-to-bill ratio stays under 1.0 for November 2016

Compiled by Mike Henley 

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Technology Development

Use Of A New Online Elemental Instrument For UPW Analysis Through An X-ray Fluorescence-based Approach

By Krag Petterson, Troy Pittenger, Josh Katz & M. Kathleen Brennan

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Microelectronics

High-purity Electrodeionization As A Cost-effective Alternative To Mixed-bed Polishers

By Anil D. Jha & Joseph D. Gifford

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UPW Micro & Pharma

UPW Micro & UPW Pharma: Save The Date

By The UPW Events Team

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Microelectronics

An Approach for Copper and Hydrogen Peroxide Removal from Copper CMP and Solar Cell Wastewater

By Michael Wismer, Christopher Riley and Adam Redding

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Technology Trends

Achieving IPA Removal In UPW From Marangoni Dryers In Semiconductor Production

By Azita Yazdani, PE and George Diefenthal

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Enduser perspectives

Troubleshooting Semiconductor Water Systems with Jill Wallin from WaferTech

By Mike Henley

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Microelectronics

Highly Ozonized UPW and Its Impact On Filters

By Jochen Ruth and Gerd Heser

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Microelectronics

What Approach Most Accurately Measures and Characterizes 10-nm Or Larger Particles In Semiconductor Water?

By Masami Murayama, Fumitaka Ichihara, and Hiroshi Sugawara

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Microelectronics

Can THM Monitoring and Removal Be Improved In High-purity Water Applications?

By John DeGenova, PhD, Philippe Rychen, Ignacy Kieler and Malek Salamor

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Backgrounder

What Are The Purity Requirements For Microelectronics UPW Piping/Distribution Systems?

By Frank Patrick, PE

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Photo courtesy of M+W Group

Archive highlight

PV Facility Design and Approaches to Water and Wastewater Treatment

By By Dana Brumley, P.E., and Ralph Williams, P.E.