| 2001‑03 |
New advantages in the production of ultra-low TOC effluents with virgin resins |
Michael C. Gottlieb & Peter S. Meyers |
|
| 2001‑01 |
A classical approach to the sizing of polishing UV TOC reducers in high-purity water plants |
Avijit Dey et al. |
|
| 2000‑10 |
TOC reduction using membrane technology |
Dean Schwarz |
|
| 1999‑10 |
Portable continuous TOC monitoring in a semiconductor water system |
Doug Bender & Anthony B. Bevilacqua |
|
| 1999‑03 |
Part 2: Results from the evaluation of on-line TOC analysisers |
Robert P. Danovan et al. |
|
| 1999‑02 |
Measurements of ultra-low levels of TOC in semiconductor water |
Patrick Gallegos et al. |
|
| 1999‑02 |
Part 1: Evaluation of on-line TOC analyzers for monitoring recycled water in semiconductor processing |
Robert P. Danovan et al. |
|
| 1998‑12 |
The value of chromatographic characterization of TOC in process water plants |
Stefan A. Huber |
|
| 1998‑08 |
Recent advancements in UV technology yield enhanced TOC reduction performance |
Bakthisaran Srikanth |
|
| 1998‑03 |
Chromatographic characterization of TOC in process water treatment |
Stefan A. Huber & Michael Gluschke |
|
| 1998‑02 |
Evaluating on-line TOC analyzers for high-purity water recycle systems |
Robert P. Danovan et al. |
|
| 1997‑02 |
Measuring TOC to maintain high-purity water |
Karen Clark et al. |
|
| 1996‑10 |
Organics, TOC, Color, Turbidity, and SDI pretreatment for unit operations |
Susan L. Coulter |
|
| 1995‑04 |
A second-generation TOC analysis for high-purity water systems |
Paul Melanson & Michael Retzig |
|
