Archive
Date | Title | Authors | Lead Text |
---|---|---|---|
2011‑12 | Sampling and Monitoring High-Purity Water Utility Systems | Wayne Bernahl | Many industrial utility operations have no good way to determine the purity of the steam that the... |
2011‑11 | Material Selection in Heat Exchangers for Hot High-Purity Water Applications | Michael Pischke, Scot Seifert, and Paul Hagen | The plate heat exchanger (PHE) is often used in high-purity water applications. The design has b... |
2011‑07 | New 450-mm PVDF Piping Systems for Conveying High-Purity Water in Semiconductor Plants | Joerg Wermelinger et al. | Look anywhere today and you can easily see that electronics, specifically the microchip, have tak... |
2010‑10 | Differences in High-Purity Water | Robert Decker | High-purity water is a relative term. Depending on the industry, the term high-purity can mean s... |
2010‑05 | High-Purity Water Needs for the PV Industry--Challenges and Opportunities | Sarah Schoen, Ph.D., Andreas Neuber, Ph.D., Marty Burkhart, John Morgan, and Slava Libman, Ph.D. | The solar photovoltaic (PV) market has demonstrated an aggregated global growth rate of more than... |
2010‑03 | Electropositive Non-Woven Filter Media for the Production of High-Purity Water | Rod Komlenic, and Christine Stanfel, Ph.D. | Every day, the need and applications for high-purity water continue to expand while at the same t... |
2010‑02 | Behavior of Metal Deposition from High-Purity Water During Wafer Rinsing Process | Drew Sinha, Ph.D., Jeff Chapman, and Richard Godec | The impact of metal contamination on semiconductor device yield is well established. Decreasing ... |
2009‑10 | High-Purity Ion Exchange Pretreatment | David Paul | This Back to Basics article describes some of the common high-purity ion exchange configurations ... |
2009‑05 | Meeting the ITRS Roadmap Guidelines for Particle Measurements in SEMICONDUCTOR High-Purity Water | Bill Shade | Deionized (DI) water is used throughout electronics manufacturing. In semiconductor manufacturin... |
2009‑01 | A Proposal for Measuring 20-nm Particles in High-Purity Water Using a New Technology | David Blackford, Ph.D., and Don Grant | The objective of the International Technology Roadmap for Semiconductors (ITRS) is οΎ“to ensure cos... |
2008‑12 | Detection and Quantification of Carboxylic Acid Excursions in High-Purity Water Using an On-Line TOC Analyzer | Terry Stange, Ph.D., Zhao Lu, and Emek Blair, Ph.D. | In a recent paper by Hanson (1), the author described carboxylic acid breakthrough in several hig... |
2008‑11 | The Use of POU Particle Measurements in High-Purity Water Applications | Bill Shade | Deionized (DI) water is used extensively in electronics manufacturing. In semiconductor manufact... |
2008‑11 | High-Purity Water Use Optimization and Wastewater Issues | Mike Henley | This article will summarize the Keynote address given at the 2007 ULTRAPURE WATER Semi conference... |
2008‑10 | Achieving Ultra-Low-Level Measurement of Anions and Cations in Semiconductor High-Purity Water | S.M. Rahmat Ullah et al. | High-purity water is of utmost importance in the semiconductor industry. Parameters such as sili... |
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