Archive



Table Tiles

Date Title Authors Lead Text
2011‑12 Sampling and Monitoring High-Purity Water Utility Systems Wayne Bernahl Many industrial utility operations have no good way to determine the purity of the steam that the...
2011‑11 Material Selection in Heat Exchangers for Hot High-Purity Water Applications Michael Pischke, Scot Seifert, and Paul Hagen The plate heat exchanger (PHE) is often used in high-purity water applications. The design has b...
2011‑07 New 450-mm PVDF Piping Systems for Conveying High-Purity Water in Semiconductor Plants Joerg Wermelinger et al. Look anywhere today and you can easily see that electronics, specifically the microchip, have tak...
2010‑10 Differences in High-Purity Water Robert Decker High-purity water is a relative term. Depending on the industry, the term high-purity can mean s...
2010‑05 High-Purity Water Needs for the PV Industry--Challenges and Opportunities Sarah Schoen, Ph.D., Andreas Neuber, Ph.D., Marty Burkhart, John Morgan, and Slava Libman, Ph.D. The solar photovoltaic (PV) market has demonstrated an aggregated global growth rate of more than...
2010‑03 Electropositive Non-Woven Filter Media for the Production of High-Purity Water Rod Komlenic, and Christine Stanfel, Ph.D. Every day, the need and applications for high-purity water continue to expand while at the same t...
2010‑02 Behavior of Metal Deposition from High-Purity Water During Wafer Rinsing Process Drew Sinha, Ph.D., Jeff Chapman, and Richard Godec The impact of metal contamination on semiconductor device yield is well established. Decreasing ...
2009‑10 High-Purity Ion Exchange Pretreatment David Paul This Back to Basics article describes some of the common high-purity ion exchange configurations ...
2009‑05 Meeting the ITRS Roadmap Guidelines for Particle Measurements in SEMICONDUCTOR High-Purity Water Bill Shade Deionized (DI) water is used throughout electronics manufacturing. In semiconductor manufacturin...
2009‑01 A Proposal for Measuring 20-nm Particles in High-Purity Water Using a New Technology David Blackford, Ph.D., and Don Grant The objective of the International Technology Roadmap for Semiconductors (ITRS) is οΎ“to ensure cos...
2008‑12 Detection and Quantification of Carboxylic Acid Excursions in High-Purity Water Using an On-Line TOC Analyzer Terry Stange, Ph.D., Zhao Lu, and Emek Blair, Ph.D. In a recent paper by Hanson (1), the author described carboxylic acid breakthrough in several hig...
2008‑11 The Use of POU Particle Measurements in High-Purity Water Applications Bill Shade Deionized (DI) water is used extensively in electronics manufacturing. In semiconductor manufact...
2008‑11 High-Purity Water Use Optimization and Wastewater Issues Mike Henley This article will summarize the Keynote address given at the 2007 ULTRAPURE WATER Semi conference...
2008‑10 Achieving Ultra-Low-Level Measurement of Anions and Cations in Semiconductor High-Purity Water S.M. Rahmat Ullah et al. High-purity water is of utmost importance in the semiconductor industry. Parameters such as sili...

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